New Fast Technology Co., Ltd. was established in February 1993. Our technical core is in ability of chemical analysis. Our lab is certified by TAF and ISO9001. We can support our customers to do research even up to PPQ level for Trace elements and 10 nm Nano-particles monitoring for electronic materials. For technology of wafer foundry and memory manufacturing, we also assist customers to do Wafer-contaminants monitoring for VOCs and MA/MB. Furthermore, by following the trend of automation, our aim is to offer our customers total solution in online trace contaminants monitoring and after-service maintenance.